Guided ultrasonic wave beam skew in silicon wafers

Pizzolato, Marco (School of Engineering and Architecture (HEIA-FR), HES-SO // University of Applied Sciences Western Switzerland) ; Masserey, Bernard (School of Engineering and Architecture (HEIA-FR), HES-SO // University of Applied Sciences Western Switzerland) ; Robyr, Jean-Luc (School of Engineering and Architecture (HEIA-FR), HES-SO // University of Applied Sciences Western Switzerland) ; Fromme, Paul (Department of Mechanical Engineering, University College London)

Keywords:
Conference Type:
full paper
Faculty:
Ingénierie et Architecture
School:
HEIA-FR
Institute:
SeSi - Institut de Systèmes d'ingénierie durables
Subject(s):
Ingénierie
Publisher:
Provo, Utah, USA, 16-21 July 2017
Date:
2018-04
Provo, Utah, USA
16-21 July 2017
Pagination:
8 p.
Published in:
Proceedings of 44th annual review of progress in quantitative nondestructive evaluation, vol. 37, Provo, Utah, USA, 16-21 July 2017
Numeration (vol. no.):
2018, 1949, 09005
DOI:
ISBN:
978-0-7354-1644-4
Appears in Collection:



 Record created 2018-10-30, last modified 2018-12-20

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