Force modulation and dynamic nanoIndentation microscopy

Foschia, Raphael (School of Engineering, Architecture and Landscape (hepia), HES-SO // University of Applied Sciences Western Switzerland) ; Jobin, Marc (School of Engineering, Architecture and Landscape (hepia), HES-SO // University of Applied Sciences Western Switzerland)

We have made a Dynamic Nanoindentation Microscope (DNM) setup based on sample modulation, in order to allow a direct comparison between various dynamical mechanical measurement techniques such as Force Modulation Microscopy (FMM) and Dynamic Mechanical Analysis (DMA). The microscope is integrated to a standard Atomic Force Microscope (AFM) and uses a commercial nanoindentation system. Instead of the standard bimorph and force modulation configuration, we used a stacked ceramic sample actuator in displacement modulation. Both DMA measurements and DNM imaging were performed on each sample for the determination of the reduced, storage and loss modules, and a good agreement between the techniques have been found. Compared to FMM, we show that DNM has the advantage of always keeping the same contrast in the viscoelastic images as a function of the frequency.


Article Type:
scientifique
Faculty:
Ingénierie et Architecture
School:
HEPIA - Genève
Institute:
inSTI - Institut des Sciences et Technologies industrielles
Date:
2007-01
Pagination:
5 p.
Published in:
Journal of Physics: Conference Series
Numeration (vol. no.):
2007, vol. 61, pp.307-311
DOI:
ISSN:
1742-6588
Appears in Collection:



 Record created 2020-05-01, last modified 2020-05-08

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