Electrical characterization of transparent organic conducting thin films preventing mechanical damage and preserving optical transparency

Kurtev, Nikolay (School of Management and Engineering Vaud, HES-SO // University of Applied Sciences Western Switzerland) ; Fosso, Narcis (School of Management and Engineering Vaud, HES-SO // University of Applied Sciences Western Switzerland) ; Tematio, Charles (School of Management and Engineering Vaud, HES-SO // University of Applied Sciences Western Switzerland) ; Tzanova, Slavka (Department of Microelectronics, Technical University of Sofia, Bulgaria) ; Schintke, Silvia (School of Management and Engineering Vaud, HES-SO // University of Applied Sciences Western Switzerland)

In this paper we propose the use of underlying ITO/glass or ITO/PET electrode structures for reliable conductivity measurements of transparent organic thin films. This technique avoids any mechanical damage of the organic thin film and furthermore preserves its optical transparency. Thin PEDOT:PSS layers with various secondary dopant concentrations of dimethyl sulfoxide (DMSO) have been studied. In particular, the degeneration under UV exposure has been investigated by electrical probing and atomic force microscopy. We find that the conductivity degeneration of PEDOT:PSS under UV exposure is reduced by a factor of two for the layers with DMSO doping.


Mots-clés:
Type de conférence:
full paper
Faculté:
Ingénierie et Architecture
Ecole:
HEIG-VD
Institut:
COMATEC - Institut de Conception, Matériaux, Emballage & Conditionnement
Adresse bibliogr.:
Singapore, Singapore, 1-4 June 2015
Date:
2015-06
Singapore, Singapore
1-4 June 2015
Pagination:
4 p.
Publié dans:
Proceedings of 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 1-4 June 2015, Singapore, Singapore
DOI:
ISBN:
978-1-4799-8362-9
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