In this paper we propose the use of underlying ITO/glass or ITO/PET electrode structures for reliable conductivity measurements of transparent organic thin films. This technique avoids any mechanical damage of the organic thin film and furthermore preserves its optical transparency. Thin PEDOT:PSS layers with various secondary dopant concentrations of dimethyl sulfoxide (DMSO) have been studied. In particular, the degeneration under UV exposure has been investigated by electrical probing and atomic force microscopy. We find that the conductivity degeneration of PEDOT:PSS under UV exposure is reduced by a factor of two for the layers with DMSO doping.
Titre
Electrical characterization of transparent organic conducting thin films preventing mechanical damage and preserving optical transparency
Date
2015-06
Publié dans
Proceedings of 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 1-4 June 2015, Singapore, Singapore
Editeur
Singapore, Singapore, 1-4 June 2015
Pagination
4 p.
Présenté à
IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), Singapore, Singapore, 2015-06-01, 2015-06-04
ISBN
978-1-4799-8362-9
Type de papier
full paper
Domaine
Ingénierie et Architecture
Ecole
HEIG-VD
Institut
COMATEC – Institut Conception mécanique et technologies des matériaux
Note
Cette publication a été rédigée par un membre de l’institut COMATEC - Institut de Conception, Matériaux, Emballage & Conditionnement.