Radiated fields from lightning strikes to tall structures : effect of upward-connecting leader and reflections at the return stroke wavefront

Mosaddeghi, Abbas (EPFL, Lausanne, Switzerland) ; Rachidi, Farhad (EPFL, Lausanne, Switzerland) ; Rubinstein, Marcos (School of Management and Engineering Vaud, HES-SO // University of Applied Sciences Western Switzerland) ; Napolitano, Fabio (University of Bologna, Bologna, Italy) ; Pavanello, Davide (Collège Champittet, Pully, Switzerland) ; Shostak, Volodymyr O. (National Technical University of Ukraine, Kyiv, Ukraine) ; Janischewskyj, Wasyl (University of Toronto, Toronto, Canada) ; Nyffeler, Markus (Armasuisse, High-Power Electromagnetic Laboratory, Spiez, Switzerland)

An extension of the engineering return-stroke models for lightning strikes to tall structures that takes into account the presence of possible reflections at the return-stroke wavefront and the presence of an upward-connecting leader is presented. Based on the approach proposed by Shostak et al., closed-form, iterative solutions for the current distribution along the channel, and the strike object are derived. Simulation results for the magnetic fields are compared with experimental waveforms associated with lightning strikes to the CN Tower (553 m). It is shown that taking into account the reflections at the return-stroke wavefront results in better agreement with the fine structure of the magnetic-field waveforms. Moreover, the obtained results are in better agreement with experimental observations, reproducing both the early narrow undershoot and the far-field zero crossing. The results also suggest that the typical double-peak response of the radiated fields from tall structures might be due to the combined effect of upward-connecting leaders and reflections at the return-stroke wavefront.


Keywords:
Article Type:
scientifique
Faculty:
Ingénierie et Architecture
School:
HEIG-VD
Institute:
IICT - Institut des Technologies de l'Information et de la Communication
Date:
2011-05
Pagination:
9 p.
Published in:
IEEE Transactions on Electromagnetic Compatibility
Numeration (vol. no.):
2011, vol. 53, no. 2, pp. 437-445
DOI:
ISSN:
0018-9375
Appears in Collection:

Note: The status of this file is: restricted


 Record created 2020-07-07, last modified 2020-07-09

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