The dark side of EDX tomography : modeling detector shadowing to aid 3D elemental signal analysis
Yeoh, Catriona S. M.; Rossouw, David; Saghi, Zineb; Burdet, Pierre; Leary, Rowan K.
2015

Résumé

A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.

Détails

Titre The dark side of EDX tomography : modeling detector shadowing to aid 3D elemental signal analysis
Auteur(s)/ trice(s) Yeoh, Catriona S. M. (University of Cambridge, Cambridge, UK)
Rossouw, David (University of Cambridge, Cambridge, UK)
Saghi, Zineb (University of Cambridge, Cambridge, UK)
Burdet, Pierre (University of Cambridge, Cambridge, UK)
Leary, Rowan K. (University of Cambridge, Cambridge, UK)
Date 2015-03
Publié dans Microscopy and Microanalysis
Volume 2015, vol. 21, no. 3, pp. 759–764
Pagination 6 p.
DOI https://doi.org/10.1017/S1431927615000227
ISSN 1431-9276
Mots-clés (libres) EDX tomography ; detector shadowing ; elemental analysis
Type d'article scientifique
Domaine Ingénierie et Architecture
Ecole HEIG-VD
Institut COMATEC – Institut Conception mécanique et technologies des matériaux
Note BURDET, Pierre est chercheur à la HES-SO, HEIG-VD, depuis 2018.
Cette publication a été rédigée par un membre de l’institut COMATEC - Institut de Conception, Matériaux, Emballage & Conditionnement.
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